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Measurement Services

SOC's  world-class measurement facility is equipped for the most demanding spectral measurement tasks. Unique measurement apparatus developed at SOC, calibration standards, data reduction software and 30 years of experience make SOC the logical choice for high quality spectral directional and bidirectional reflectance measurements for modeling, simulation, special effects and low observable study.

Spectral measurements can be made in wavelength regions from the ultraviolet  to long wave infrared and include one or all of the following types of reflectance measurements:

Directional or hemispheric reflectance : the fraction of the light incident on a sample at a given angle that is reflected back into the hemisphere.

Bidirectional Reflectance Distribution Function (BRDF):the distribution of light, described as a function of two angles, reflected back into the hemisphere from light incident at a given angle on a sample.

Monostatic Bidirectional Reflectance(enhanced backscatter measurement): a small portion of the BRDF measured at the direct backscattered angle using a laser interferometric reflectometer.

 

 

 

Optical Properties and Temperature Profile Databases

SOC is continuously developing and expanding on its off-the-shelf  library of optical properties data for a variety of materials. This library can be purchased in whole or in part at considerable savings over individual measurements. For more information on our database and its contents contact SOC. You can also download the Optical Properties Database brochure. A list of FAQ regarding the database, and information on using the databases in 3D sensor simulation.

  • Spectral Reflectance Data for (52) rocks, (29) soils, (28) vegetation types, (41) construction materials, (38) paints, and (12) fabrics from 0.3 to 25 microns.
  • Hemispherical, Directional, Diffuse and Specular
  • Surface temperatures versus time-of-day, climate and orientation
  • Complete solution for visual and infrared radiance simulation.

3D Models for Sensor Simulation

SOC is constantly developing computationally efficient polygonal models for accurate sensor simulation. Unlike visual simulation models, sensor models require an intimate understanding of the physical nature and physics responsible for the signature of an object. SOC's extensive background in both Infrared and Radar sensor simulation and analysis is incorporated into all of our 3D models.

  

 

 

 

 

 

   

Surface Optics Corporation 11555 Rancho Bernardo Rd.San Diego, CA 92127
Phone: 858.675.7404 Fax: 858.675.2028

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