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Measurement
Methods
Directional
Reflectance
UV, Visible,
Near-IR
Over the
wavelength range 0.3 to 2.0 mm, SOC employs a Cary 14
spectrophotometer fitted with transfer optics and a 9 inch
diameter integrating sphere. This instrument is capable of
measuring directional reflectance from the normal to angles of
75 to 80° from normal. It is a dual beam instrument operating
in the absolute mode.
The Cary 14
employs a lead sulfide detector in the near-IR and a phototube
detector in the visible and near-UV. Polarized reflectance
measurements are made using a pair of Glan-Thompson
prisms.
Mid to Long Wave
Infrared (IR)
For mid to long
wave IR reflectance SOC utilizes an ellipsoidal reflectometer
designed and built by Surface Optics called the SOC-100. The
ellipsoidal reflectometer is used instead of an integrating
sphere because of the lack of energy throughput from
integrating spheres at long wavelengths. The SOC-100 overcomes
this problem by focusing the energy from a 1300° F blackbody
back down onto either the reference standard or the sample.
Energy reflected off the sample is collected with an overhead
mirror and steered into an FTIR for deconvolution into the
measured spectrum.
Reflectance
measurements can be made from 1.5 to 50.0 um at incident
angles of 10 to 80° from normal and out to 200.0 um at
near-normal incidence. In addition to reflectance, the SOC-100
can be employed to collect transmittance data as well.
Operating wavelengths for transmittance are the same as
reflectance while incident angles are from normal to 60° from
normal.
Specular/diffuse
information can be collected using the specular beam blocker
attachment on the SOC-100. By blocking the specular
reflectance the instrument can gather diffuse reflectance
(DDR). The DDR is then subtracted from the HDR to yield
information on how specular the material is. This technique is
extremely useful in screening samples before more extensive
BRDF is utilized.

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Bidirectional
Reflectance (BRDF)
SOC has two BDR
instruments. One instrument is generally employed with a large
blackbody or quartz halogen source for measurements in the infrared
or visible respectively. This
instrument utilizes a cryogenic (liquid nitrogen or liquid
helium) cooled detector or phototube detector and synchronous detection for maximum
signal-to-noise ratio. It is routinely used to make BDR
measurements anywhere in the wavelength range of 0.3 to 20
nm.
Wavelength
determination is made by narrow band interference filters.
Bidirectional measurements are made over the entire hemisphere
subtending the sample, normalizing the results to the
directional reflectance or can be made relative to a known
reference standard.
The second
instrument at SOC is a unique device that measures
backscatter within a one degree cone of the incident
direction, and is routinely being used to characterize the
monostatic BDR of strategic materials. The uniqueness of this
instrument resides in its ability to make higher angular
resolution measurements (~ 0.4°) including measurements at the
exact anti-incident direction for any incident angle from
normal to grazing. Speckle resolved measurements are typically
made for all four principle polarization combinations of
source and detector. Currently measurements are being made at
0.488, 0.6328, 1.06, 3.39, and 10.6 mm, but other wavelength
choices can be accommodated.
The importance of
the high-resolution retroreflectance measurements,
particularly to laser radars, is that some materials exhibit
significant enhanced backscatter in the anti-incident
direction, even for smooth surfaces (surface asperities and
lateral correlation lengths less than the wavelength of the
illuminating source). These materials need not necessarily be
metallic, but at the present time this phenomenon can only be
explained for metals. Furthermore, the phenomenon can only be
seen with high angular resolution because the reflected spike
is so narrow.
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