SOC 200 Bidirectional Reflectometer

SOC The SOC 200 Bidirectional Reflectometer is a precision laboratory instrument designed for mapping bidirectional reflectance distribution functions (BRDF) of surfaces, paints, coatings, liquids and particles. BRDF data gives engineers the necessary information to adequately solve problems requiring precision information about the direction and magnitude of energy scattered from a surface.

The SOC 200 measures the BRDF of samples from the ultraviolet to infrared (including visible) using an assortment of interchangeable sources, spectral bandpass filters and detectors. An optical source polarizer and detector analyzer give the instrument linearly polarized BRDF capability using either broad band or laser sources. Muller matrix measurements are also possible with additional polarization optics. Complete hemispherical coverage is obtained by varying both incident polar and azimuth angles and reflected polar and azimuth angles.

Several new features have been added to its already extensive list of capabilities. These include an automated bandpass filter wheel that is capable of holding up to twenty different bandpass filters. This allows the user to take hyper-spectral BRDF data over twenty different wavelengths during a single measurement run. The user had previously been limited to a single wavelength per measurement. Support for new sterling cycle cooled MCT and InSb detectors allow the instrument to collect unattended BRDF data continuously over several days. The software has been significantly improved and is now fully 32-bit and supports Windows 2000. Many new minor enhancements have also been added that improve the overall performance of the existing design making the SOC 200 the premiere Bidirectional Reflectometer.

Contact

Phone: 858.675.0131
Email: soc410@surfaceoptics.com

SOC 200 Light Sources and Attachments

The following light sources are available:

0.488 µm ArKr Laser
.6328 µm HeNe Laser
1.06 µm Nd:YAG Laser
3.39 µm HeNe Laser
10.6 µm CO2 Laser

Each laser is available with:

mounting hardware
beam expansion optics
Mueller matrix optics for retro-reflectance attachment

Low Resolution Retro-Reflectance Attachment includes:

beam splitter
low scatter chopper mounted to detector arm.

Surface Optics Corporation 11555 Rancho Bernardo Rd. San Diego, CA 92127
Phone: 858.675.7404 Fax: 858.675.2028