InspectIR™-Vis

The InspectIR™-Vis is based on a modified integrating sphere. It measures total reflectance at four sub-bands in the 400 – 1100 nm spectral range. The signal intensity is normalized against an internal standard. Total, diffuse, and specular reflectance is reported for the data at 20° incidence. A total of twelve data points are produced during a single data acquisition cycle. To perform measurements the unit is pressed up against the surface to be tested and the trigger is pressed to record the data. It is a real portable battery powered reflectometer controlled by a built in PDA type computer.

Features:

Measures reflectance between 400 and 1100 nm in four discrete bands
Measures total, diffuse and specular reflectance
Fully portable
Battery operated

Benefits:

Measures reflectance of large objects
No alignment problems
Works in the field
Provides absolute reflectance values

Just another tool in your toolbox.

Contact

Phone: 858.675.0131
Email: soc410@surfaceoptics.com

Surface Optics Corporation 11555 Rancho Bernardo Rd. San Diego, CA 92127
Phone: 858.675.7404 Fax: 858.675.2028